溴化碲分光光度法测定钛铝合金中微量碲

TeBr 4 Spectrophotometric Determination of Trace Te in TiAl Alloy

溴化碲分光光度法应用于钛铝合金中微量碲的测定，取得了良好的效果。干扰试验表明，在所选定条件下，Ｚｎ，Ｍｎ，Ｍｇ，Ｐｂ，Ｍｏ，Ａｓ，Ｙ，Ｓｎ，Ｎｂ，Ｓｂ，Ｐ，Ｃｏ，Ｎｉ，Ｃａ，Ｓｉ，Ｃｄ，Ｂｉ，Ｃｅ，Ｚｒ，Ｗ，Ｖ各１ｍｇ，Ｃｕ，Ｃｒ各０．１ｍｇ，Ｆｅ为０．２ｍｇ，对１００μｇＴｅ的测定基本无干扰。ＴｉＡｌ基体的轻微干扰可以用同量的ＴｉＡｌ作参比而消除。分别对含Ｔｅ０．１００％和０．０２０％的两组合成试样进行１２次测定，测定结果分别为０．１０４％和０．０２０％，其标准偏差分别为０．００２４％和０．００２０％，变异系数分别为２．３％和１０．０％，此法准确、简便、重现性好，可适用于含Ｔｅ０．０２０％～０．２０％的钛铝合金中碲的测定。

TeBr 4 spectrophotometric determination of trace Te in TiAl alloy has been studied The interference experiment has been also carried out The experimental results show that Zn,Mn,Mg,Mo,As,Y,Pb,Sn,Nb,Sb,P,Co,Ni,Ca,Si,Cd,Bi,Ce,Zr,W,V(all1mg),Cu,Cr(all 0 1mg)and Fe(0 2mg) have no effects on the determination of Te(100μg) under the selected conditions The trifling effect of TiAl matrix can also be eliminated by using the contrast color of same TiAl quantity 12 experiments have been carried out for synthetic samples containing 0 100% Te and samples containing 0 020% Te, respectively The corresponding determination average are 0 104% and 0 020%, and the standard deviations are 0 0024% and 0 0020%, and the corresponding relative standard deviation coefficients are 23% and 10 0%, respectively, The method presented in this paper is accurate, concise and repeatable, which can be used for the determination of trace tellurium (0 020% to 0 200%) in titanium-aluminium alloy