期刊文献+

多相体系的多晶电子衍射分析 被引量:2

Polycrystalline electron diffraction analysis of multiphase system
下载PDF
导出
摘要 本文介绍为分析多相体系的多晶电子衍射图而设计编写的计算机程序。多相体系是指含有两种或两种以上多晶晶体相,其电子衍射图较为复杂。该程序可用于模拟合成的多相体系的多晶电子衍射,其强度分布可随其构成的单相峰高、峰宽与峰位的变化而变化,这三个量分别与该相的含量、晶粒尺度、所用相机常数相关。该程序有助于实验结果分析或作为相关教学工具。 In this paper a computer program was described, which is designed for analysis of polycrystalline electron diffraction pattern of a multi-phase system .A multi-phase system may contain two or more polycrystalline phases, the electron diffraction of such a system produces a complicated ring pattern. The program can be used to simulate the resultant ring pattern by adjusting the peak height, peak width, or peak position in each pattern, which is related to the quantity of the corresponding phase, its grain size, and the camera length. This program is helpful to interpret experimental result and can be also used as a teaching tool.
作者 李兴中
出处 《电子显微学报》 CAS CSCD 2008年第1期47-50,共4页 Journal of Chinese Electron Microscopy Society
关键词 多相体系 多晶电子衍射 计算机程序 muhiphase polycrystalline electron diffraction computer program
  • 相关文献

参考文献7

  • 1Walck S D, Ruzakowski-Athey P. Proceeding of Microscopy and Microanalysis (MM98, July, 1998, Atlanta, Georgia), 1998.
  • 2Moberly Chan W, et al. Proceeding of Microscopy and Microanalysis (MM98, July, 1998, Atlanta, Georgia), 1998.
  • 3Janos L. Labar, Proceeding of the 12th European Congress on Electron Microscopy (EUREM12, July, 2000, Bmo, Czech Republic),2000.
  • 4Li X Z. Ultramiroscopy, 2004,99 : 257.
  • 5Li X Z. Proceeding of Microscopy and Microanalysis ( MM07, August, 2007, Florida, USA), 2007.
  • 6Blaekman M. Proc Roy Sac A,1939,173:68.
  • 7Li X Z, Zhang J, Sellmyer D J. Solid State Communication, 2007,141:398.

同被引文献24

  • 1宋亚娟,李翠清,孙桂大,黄顺贤.焙烧条件对新型磷化钨催化剂加氢活性的影响[J].北京化工大学学报(自然科学版),2006,33(4):57-60. 被引量:4
  • 2Robert W Cahn.走进材料科学[M].杨柯,译.北京:化学工业出版社,2008:18.
  • 3Sun M Y, Adjaye J, Nelson A. Appl. Catal. A, 2004, 263 : 131 - 143.
  • 4Eijsbouts S, Heinerman J J L, Elerman H J W. Appl. Catal. A, 1993, 105 ( 1 ) : 53 - 68.
  • 5Hensen E J M, Kooyman P J, Van Der Meet Y, Van Der Kraan A M, De Beer V H J, Van Veen J A R, Van Santen H A. J. Catal. , 2001, 199(2) : 224 -235.
  • 6Eijsbouts S, Van Den Oetelaar L C A, Puijenbroek R R V. J. Catal. , 2005, 229(2) : 352 -364.
  • 7Pawelec B, Castano P, Zepeda T A. J. Appl. Surf. Sci. , 2008, 254(13) : 4092 -4102.
  • 8周玉,武高辉.材料X射线衍射与电子显微分析.2版.哈尔滨:哈尔滨工业大学出版社,2007:1-2.
  • 9黄孝瑛,候耀永,李理.电子衍衬分析原理与图谱[M].山东:山东科学技术出版社,2000.
  • 10Abhijit K,Sudipta M,Venkateswarlu K.Characterization of interface of Al2O3-304 stainless steel braze joint[J].Materials Characterization,2007,58:555-562.

引证文献2

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部