摘要
分析了用TEM室进行射频辐射抗扰度试验时遇到的两个问题,即受试设备处于什么位置时会出现最大耦合和当受试设备发生故障时骚扰信号是以何种途径耦合进入受试设备的,并给出了相应的解决办法。
Because of the TEM＇s superiority, it is used for immunity test, but we often encounter two problems in testing, this paper analyses the two problems and recommends method overcoming the two problems.
