电子装备随机存储器通用测试算法

A General Testing Algorithm for Random Access Memory in Electrical Equipment

随机存储器在电子装备中广泛使用,对其进行有效测试是电子装备自测试与生产功能测试的主要内容。以走一测试算法为基础,设计了数据线、地址线与存储单元测试方法,可以有效检测各种类型的RAM焊接质量与器件质量,对于提高故障定位精度和减少产品的测试时间起重要作用,特别是在电子装备的自测试、生产测试和维护测试中具有很好的应用前景。

RAM is used widely in electrical equipment, so RAM testing is a key part for built-in test and functional test, Based on walking one algorithm, methods for data bus, address bus and data： unit are proposed. The general testing algorithm can test soldering quality and device quality for RAM, it can improve fault positioning and reduce the testing time. There is a very good application in built-in test and production test and maintenance test.