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绝缘老化试验用钨针尖电极的制备 被引量:1

Preparation of the Tungsten Pin Electrode Using in the Insulating Aging Test
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摘要 设计了一套采用检测电流变化率对制作绝缘老化试验用钨针尖电极进行控制的试验装置,使切断电流的时间控制在ms级以下,制作出半径在μm级的分散性较小的钨针尖电极,并进一步对试验参数(如:钨丝直径,阴极孔径大小等)对试验结果的影响进行了分析。分析和实验表明,本方法制备时间短,脱离速度快,实验效果良好。 A set of the test equipment is designed, which makes the tungsten pin electrode using the ratio of the current change, and cutting off time is limited below millisecond. The radius of the tungsten pin electrode is made below micrometer and has lesser dispersibility. The effects of the test parameters on the resuits are analyzed such as the diameter of the tungsten filament, the aperture of the cathode and so on. It is proofed that the time of the preparation is short, the escape velocity is speedy and the resuh is good
作者 刘洋 杨春
出处 《黑龙江水专学报》 2008年第1期110-111,共2页 Journal of Heilongjiang Hydraulic Engineering College
关键词 电化学腐蚀 钨针尖 电流变化率 electrochemical corrosion tungsten pin ratio of current change
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  • 1胡小唐,郭育,刘安伟,吉贵军.微探针电化学加工机理及针尖尺寸控制技术[J].化工学报,1995,46(5):557-561. 被引量:8
  • 2Liu Anwei, Hu Xiaotang, Liu Wenhui, et al. Improved Control Technique for the Electrochemical Fabrication Scanning Tunneling Microscopy Micro Tips[J].Review of Scientific Instruments, 1997, (68): 3811-3813.
  • 3曾繁章,郭钟宁,刘江文.微细电化学加工技术[J].机电工程技术,2005,34(5):11-14. 被引量:6
  • 4Lyding W,Shen Y C ,Hubacek J S ,et al. Abeln GC[J].Appl Phys Lett ,1994,64:2010.
  • 5Kerfriden S, NahleA H, Campbell SA, et al. The Electrochemical Etching of Tungsten STM Tips[J].Electrochimica Acta, 1998,43(12-13):1939-1944.
  • 6B inning G. Rohrer H1 Surface Studies by Scanning Tunneling Micro Scope[J].Phys Rev Lett, 1982, 49(1): 572-611.

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