摘要
去嵌入是一种射频微波精确测量技术。本文介绍了一种新型的去嵌入测量技术。该方法只需要一个对称的直通微带结构就能完成去嵌入。最后利用该方法对0603封装的电感进行了测量,并提取了精确测量后的电感模型。结果表明本去嵌入方法可以应用于射频PCB上器件模型的精确测量和模型提取。
De-embedding is one of the precision RF and microwave measurements. A novel de-embedding technique is presented in this paper. This method is unique in that one single symmetric THRU de-embedding structure is required. A 0603 inductor is measured and the extrinsic model of this device is extracted using this method. The results indicate this new technique is useful in RF PCB devices measurement and modeling.
出处
《电路与系统学报》
CSCD
北大核心
2008年第2期132-134,35,共4页
Journal of Circuits and Systems