摘要
在深亚微米大规模集成电路设计和制造过程中,可靠性已经成为主要的挑战[1]。文章关注一个重要的可靠性问题?天线效应。首先对天线效应进行分析,然后用SKILL语言设计了自动天线效应修复器。提出了版图层次坐标变换算法:把底层单元坐标属性转换到顶层统一的坐标系中,而不破坏其原有的层次化结构。该工具能在版图中自动修复天线效应,实践结果显示,修复率达90%以上。
Reliability has become a major challenge in the design and manufacture of deep submicron VLSI circuits. Antenna effect, which is an important reliability issue, was analyzed in general, and an automatic fixing tool with SKILL language was designed. A CTHL （coordinate transform in hierarchy layout） algorithm for the tool was presented, which could transform the cell＇s coordinates in the bottom level to the top level without destructing its original hierarchy structure. The tool fixes the antenna effect automatically in the layout. Experimental results show that the fixing rate is up to 90%.
出处
《微电子学》
CAS
CSCD
北大核心
2008年第2期182-186,共5页
Microelectronics
基金
国家自然科学基金资助项目(90407009)"基于测试压缩和LBIST的系统芯片低成本测试技术研究"
