基于信息流模型和列表寻优法的装备BIT系统测试选择技术研究

Research on Test Selection Technology Based on Information Flow Model and TABU for Equipment BIT System

测试选择是测试性设计的基本步骤之一。在诊断BIT系统设计过程中,针对不同的测试对象,特别是复杂的电子设备,如何选择最优化的测试策略,降低总体测试性费用,是设计人员一直关心、关注的问题。文中首先基于信息流模型对测试选择问题进行了研究,然后对列表寻优法进行了改进,并给出了测试选择的一种快速求解算法,最后通过实例对算法的有效性进行了验证。

Test selection is the basic approach to achieve testability design. During design of BIT system diagnosis, how to select optimal test strategy and realize the lowest test cost when facing different test object, especially for complex electronic equipment, is the problem which designers focusing all the time. The test problem based on information flow model was first studied, then the TABU method was improved and a double-quick arithmetic for test selection was given. In the end, the effectiveness of the arithmetic was validated by an example.