期刊文献+

基于性能退化的功能电路软故障可靠性分析

The Study of Functional Circuit Soft Fault Reliability Based on Performance Degradation
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摘要 通过对电子功能电路退化量分布的分析,提出了一种基于性能退化的功能电路软故障可靠性分析方法,并以某型雷达放大电路功能电路为例进行了试验,根据静态工作点的变化所引发的软故障,进行了电路的软故障可靠性分析。 In this paper, the degradation of the circuit parameter is analyzed. A reliability analysis method based on the soft fault model that is caused by the degradation of parameters is put forward. And the accelerated degradation test of an amp Based on the change of the static state of the circuit and curve of the functional circuit's soft fault is given. lifying circuit in a radar is carried out. the analysis of the data, the reliability
出处 《电子产品可靠性与环境试验》 2008年第2期25-28,共4页 Electronic Product Reliability and Environmental Testing
基金 国家自然科学基金项目(60472009)资助
关键词 软故障 性能退化 可靠性 soft fault performance degradation reliability
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参考文献3

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