基于C8051F340的三维测量仪器开发

Development of 3-D Measurement Apparatus Based on C8051F340 MCU

根据投影栅相位轮廓术的四步相移法开发三维测量仪器,介绍仪器的测量原理,设计光学投影系统、相移机构及图像采集模块来实现四步相移法,利用C8051F340单片机搭建硬件控制平台并开发了相应的控制软件。研制出一台三维测量仪器,完全满足工业及相关三维测量的需求。仪器具有体积小、操作方便、测量速度快、精度高的优点,并且是基于USB接口的数据通信,易于移动。

The 3-D measurement apparatus is developed based on four-step phase-measuring method, which belongs to phase detection of projected gating. The measurement theory is introduced and the four-step phase-measuring method which includes designing the optics-projection system, the machine of phase-measuring, and collecting module of image is carried out. The C8051 F340 is the main COMS chip of the control system, and with which the corresponded software is designed. The apparatus can be used for 3-D measurement in industry and be suitable for many other occasions too. It has many merits, such as small volume, convenient control, fast measurement velocity, prefect precision, and using USB for communications, so it is convenient for renlotion.