摘要
We have the great pleasure to announce that the JEOL High-End Transmission Electron Microscopy Seminar shall be held on 17 June,2008 in Beijing. To provide cutting-edge electron microscopy,several world well known researchers are invited to deliver their talks on recently prominent accomplishment by using the latest transmission electron microscopes.Special interest shall focus on the latest "aberration corrected" TEM and STEM and their abundant applications in imaging and analysis.To provide update information in advanced TEM sample preparation technologies,multi-beam system and the ion-milling shall also be the topics of this seminar.
出处
《电子显微学报》
CAS
CSCD
2008年第2期172-172,共1页
Journal of Chinese Electron Microscopy Society
