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Shape measurement by carrier modulation in electronic speckle pattern interferometry 被引量:1

Shape measurement by carrier modulation in electronic speckle pattern interferometry
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摘要 A shape measurement based on ESPI by using carrier is presented. When the tested object is tilted with a small angle,the carrier pattern containing altitude information is formed on the object surface. By using the carrier pattern captured by a CCD camera,the phase of the object can be derived by Fourier transform and the shape measurement is realized. The principle of the method is introduced and proved by an experiment.
出处 《Optoelectronics Letters》 EI 2008年第3期223-226,共4页 光电子快报(英文版)
关键词 测量方法 载波 电子 散斑 测量方法 载波 电子 散斑
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