用全速电流测试方法检测PIC12F509微处理器

Using at Speed Current Testing Method to Test PIC12F509 Microprocessor

全速电流测试是一种新的电路测试方法。这里将一种指令级的全速电流测试方法应用到RISC指令集流水线结构的PIC12F509微处理器测试实验中。实验结果表明使用指令级的全速电流测试方法对PIC12F509微处理器进行测试是可行的。

At speed current testing is a latest method for circuit test, it is rarely used in the experiment for testing for the moment. This paper has used a method called instruction level at speed current test in the experiments for testing PIC12FS09 microprocessor which employs a RISC architecture and pipelining. The experimental results show that the instruction level method is fit for testing PIC12FS09 microprocessor.