浅谈存储器测试

Shallow to Talk About Memory Test

随着半导体存储器向多品种、高速和高集成化等方向发展,测试问题显得越来越突出和重要。下面主要介绍了存储器电路的分类,以及存储器电路的测试参数和测试向量。

Now it becomes more and more important and highlighted in the testing of semiconductor memory by the development of its varieties, high - speed and high - integrated intention. The authors mainly show us the assorting of memory, the testing parameters and the testing vector of memory circuits.