期刊文献+

基于多层膜偏振元件的软X射线磁光Faraday偏转测量

Soft X-ray magmeto-optical Faraday rotation measurements with the multilayer polarizer
原文传递
导出
摘要 在北京同步辐射装置(BSRF)的3W1B软X射线光束线上利用自行研制的同步辐射软X射线综合偏振测量装置对Ni的M2,3边附近(60—70eV)进行了软X射线磁光(magneto-optical)法拉第效应(Faraday effect)的偏转测量,实验装置主要由起偏器,检偏器,样品架,圆形钕铁硼永磁铁和MCP探测器组成,偏振元件(起偏元件和检偏元件)均采用反射式非周期性Mo/Si宽带多层膜.实验采用反射起偏和反射检偏的模式,得到一系列能量范围在60—70eV间的法拉第偏转角结果,结果表明在Ni的M2,3边附近法拉第效应最为明显,当能量为65.5eV和68eV时,Faraday偏转角分别为1.79°±0.19°(1.79°为正反向磁场偏转角大小的平均值)和-0.76°±0.09°(0.76°为正反向磁场偏转角大小的平均值). We measured magneto-optical (MO) Faraday rotation around the M2,3 edges (60--70 eV) of Ni film on 3W1B beam line of Beijing Synchrotron Radiation Facility (BSRF) in the soft X-ray region through a versatile polarimeter with mutilayer polarizers, which is mainly composed of polarizer, analyzer, sample frame, round NdFeB permanent-magnet and MCP detector. We used the reflective aperiodic molybdenum/silicon broadband multilayer polarizers as the polarizer and the analyzer in the versatile polarimeter, and obtained a series of Faraday rotation results in the 60--70 eV region. The results demonstrate that the Faraday rotation angles are obviously large around Ni M2,3 edges, the rotation angles are 1.79± 0. 19°(average rotation angle in parallel and antiparallel magnet fields) and - 0.76±0. 09° (average rotation angle in parallel and antiparallel magnet fields) at the energy 65.5 eV and 68 eV, respectively.
出处 《物理学报》 SCIE EI CAS CSCD 北大核心 2008年第5期2860-2865,共6页 Acta Physica Sinica
基金 国家自然科学基金(批准号:10275078,10435050)资助的课题~~
关键词 软X射线 磁光Faraday效应 综合偏振测量装置 宽带多层膜 soft X-ray, magneto-optical Faraday rotation, versatile polarimeter, broadband multilayer
  • 相关文献

参考文献13

二级参考文献57

  • 1王劼,李红红,王峰,郭玉献,周红军,薛松,卢启鹏.软X射线磁性圆二色光束线的调试和实验[J].核技术,2005,28(7):489-495. 被引量:7
  • 2Hunter W R. Design criteria for reflection polarizers and analyzers in the vacuum ultraviolet[J]. Appl. Opt., 1978, 17(8): 1259--1270.
  • 3Spiller E. Soft X-ray Optics[M]. SPIE, Bellingham, 1994.
  • 4Soufli R, Spiller E A, Schmidt M A, et al. Multiphyer optics for an extreme-ultraviolet lithography tool with 70-nm resolution [J ].Proc. SPIE, 2001, 4343:51--59.
  • 5Schafers F, Mertins H, Gaupp A, et al. Soft X-ray polarimeter with multiplayer optics: complete analysis of polarization state of light[J]. Appl. Opt., 1999, 38(19):4074--4088.
  • 6Kortright J B, Rice M, Kim S K, et al. Optics for element-resolved soft X-ray magneto-optical studies[J ]. J. of Magnetism and Magnetic Materials, 1999, 191:79--89.
  • 7Yamamoto M, Mayama K, Kimura H, Furudate M, Yangagihara M. The first thin film ellipsometry at a photo energy of 97ev with use of high performance multiplayer polarizers [ J ]. Proc. SPIE,1996, 2873: 70---73.
  • 8Stearns D G, The scattering of x-rays from nonideal multiplayer structures[J]. J. Appl. Phys., 1989, 65(12):491--506.
  • 9Spiller E, Grebe K, Golub L. SPIE, 1989, 66: 1160-1161
  • 10Stearns D G, Rosen R S, Vernon S P, Appl Opt, 1993, 32:6952-6953

共引文献12

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部