X射线荧光分析仪测量精确度和工作条件及其谱形关系

The instrumental condition, spectrum shape and measuring precision of an X-ray fluorescence analyzer

本文通过分析同位素X射线荧光分析仪的工作条件和谱形的关系,来判选仪器的正确工作条件,以此提高仪器系统长期测量精确度。

By analyzing the spectrum shapes related to the instrumental condition, an optimized instrumental condition of the X-ray fluorescence analyzer is proposed in present paper, so as to improve the long-term measuring precision of the analyzer.