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流水线模数转换器的一种数字校准技术 被引量:5

A Digital Calibration Technique of Pipelined Analog-to-Digital Converter
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摘要 为了降低流水线模数转换器中数字校准电路的规模和功耗,提出了一种新的基于信号统计规律的后台数字校准技术.该技术采用自适应搜索算法和二元单调函数的幅值增量比较算法,分别对基于信号统计规律的数字校准技术中的距离估计电路和查找表进行了优化设计,减少了距离估计所需的数字电路和查找表所需的ROM空间,极大地降低了数字电路的规模和功耗.应用该校准技术实现了一个12位、采样率为4×10^7s^-1的流水线模数转换器.测试结果表明,同优化前相比,该芯片数字电路的功耗降低了93%, To reduce the power dissipation and chip size of digital calibration circuits of pipelined analog-to-digital converter (ADC), a new statistics-based background calibration technique is presented. In order to improve both the residual distance estimator circuit and the design of look up table (LUT) in binary monotonically function, an adaptive search algorithm and a magnitude incremental comparison algorithm are used in the calibration technique. The technique can reduce the digital circuits' scale of distance estimator and the memory of ROM of LUT. By using the technique, the power dissipation in digital circuits and the chip size are reduced significantly. The improved technique is applied in the implementation of one 12 bit 4 × 10^7 s^-1 pipelined ADC. The tested results show that power consumption of digital circuits is reduced by 93% and the memory of ROM is saved by 95%, compared with the unimproved technique. The ADC implemented in SMIC 0. 18 μm CMOS process consumes 210 mW, and occupies a chip area of 3. 3 mm×3. 7 mm.
出处 《西安交通大学学报》 EI CAS CSCD 北大核心 2008年第6期759-759,共1页 Journal of Xi'an Jiaotong University
基金 西安应用材料创新基金资助项目(XA-AM-200506).
关键词 流水线模数转换器 校准技术 自适应搜索算法 种数 数字电路 校准电路 统计规律 优化设计 pipelined analog-to-digital converter digital calibration adaptive search algorithm magnitude incremental comparison algorithm
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  • 1Maxim Teslenko,Elena Dubrova.Hermes:LUT FPGA technology mapping algorithm for area minimization with optimum depth.IEEE 2004:T48
  • 2Zhang W,Jullien G A,Dimitrov V S.A programmable base 2D-LNS MAC with self-generated look-up tables.Circuits and systems,2004.ISCAS '04.Proceedings of the 2004 International Symposium on Volume 2,2004,2:Ⅱ-789~792
  • 3Boris Murmann and Bernhard E.Boser.A 12-bit 75MS/s pipelined ADC using open-loop residue amplification.IEEE Journal of Solid-state circuit,2003,38(12):2043

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  • 1易婷,洪志良.深亚微米CMOS运算放大器的综合[J].计算机辅助设计与图形学学报,2004,16(12):1631-1639. 被引量:8
  • 2IEEE Instrumentation and Measurement Society, IEEE Std. 1241-2000 IEEE standard for terminology and test methods for analog to digital converters [S]. New York, USA:The Institute of Electrical and Electronics Engineers,Inc. , 2000.
  • 3IEEE Instrumentation and Measurement Society. IEEE Std. 1057-1994 (R2001) IEEE standard for digitizing waveform recorders [S]. New York, USA: The Institute of Electrical and Electronics Engineers Inc. , 2001.
  • 4DOERNBERG J, LEE H S, HODGES D A. Fullspeed testing of A/D converters [J]. IEEE Journal of Solid-State Circuits, 1984, 19(6):820-827.
  • 5CARBONE P, Petri D. Noise sensitivity of the ADC histogram test [J]. IEEE Transactions on Instrument and Measurement, 1998, 47(4) : 1001-1004.
  • 6WAGDY M F. Effect of various dither forms on quantization errors of ideal A/D converters [J]. IEEE Transactions on Instrument and Measurement, 1989, 38(4) : 850-855.
  • 7MURMANN B, BOSER B E. Digitally assisted pipeline ADCs [M]. Boston, MA, USA: Kluwer Academic Publishers, 2004: 75-100.
  • 8PATRICK D F, MILLER I. Analog behavioral modeling with the Verilog-A language [M]. Boston, MA, USA: Kluwer Academic Publishers, 2003: 12-24.
  • 9GUSTAVSSON M, WIKNER J J, TAN N N. CMOS data converters for communications [M]. Boston, MA, USA: Kluwer Academic Publishers, 2000. 232- 299.
  • 10KEANE J P, HURST P J, LEWIS S H. Background interstage gain calibration technique for pipelined ADCs [J]. IEEE Trans Cire and Syst, 2005, 52(1).32-43.

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