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Microscopic model for chemical etchability along radiation damage paths in solids

Microscopic model for chemical etchability along radiation damage paths in solids
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摘要 It would be very interesting to develop a picture about removal of atoms from the radiation damaged paths or latent nuclear tracks and undamaged bulk material in track detectors. Here, theory of chemical etching is described briefly and a new model for chemical etching along radiation damaged paths in solids is developed based on basic scientific facts and valid assumptions. Dependence of chemical etching on radiation damage intensity and etching conditions is discussed. A new parameter for etching along radiation damaged paths is introduced, which is useful for investigation of relationship between chemical etchability and radiation damage in a solid. Results and discussion presented here are also useful for further development of nuclear waste immobilization. It would be very interesting to develop a picture about removal of atoms from the radiation damaged paths or latent nuclear tracks and undamaged bulk material in track detectors. Here, theory of chemical etching is described briefly and a new model for chemical etching along radiation damaged paths in solids is developed based on basic scientific facts and valid assumptions. Dependence of chemical etching on radiation damage intensity and etching conditions is discussed. A new parameter for etching along radiation damaged paths is introduced, which is useful for investigation of relationship between chemical etehability and radiation damage in a solid. Results and discussion presented here are also useful for further development of nuclear waste immobilization.
机构地区 Physics Division
出处 《Nuclear Science and Techniques》 SCIE CAS CSCD 2008年第3期174-177,共4页 核技术(英文)
关键词 固态径迹探测器 晶体缺陷 辐射损伤 固体 Radiation damage, Chemical etchability, Fission fragments, Nuclear track detection technique, Nuclear waste immobilization, Nanofabrication
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