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逐次截尾样本下电子元件混联系统可靠性指标的EB估计 被引量:3

EB Estimation of the Reliability Performance for Compound System with Electronic Components Based on Progressively Censored Sample
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摘要 在逐次截尾样本下,研究电子元件混联系统可靠性指标的估计问题。将Bayes方法和极大似然法相结合,在平方损失下,获得部件失效率、系统可靠度和平均寿命的经验Bayes估计。最后给出随机模拟例子,说明该方法的正确性。结果表明可靠性指标的经验Bayes估计值精度较高。 Based on progressively censored sample, the problems of estimating the reliability performance for compound system with electronic components are studied by using Bayes and MLE approaches. Under the squared loss, the formulae to calculate Empirical Bayes (EB) estimation of the failure rate, the reliability function and mean lifetime for the system are given. Finally,an illustrative numerical example is examined by means of the Monte - Carlo simulation. It is shown that the method proposed in this paper is correct. The results prove that empirical Bayes estimation of reliability performance has high precision.
作者 师小琳
机构地区 西安邮电学院
出处 《现代电子技术》 2008年第12期1-3,10,共4页 Modern Electronics Technique
基金 国家自然科学基金资助项目(70471057) 陕西省教育厅自然科学基金资助项目(03JK065)
关键词 混联系统 可靠性指标 逐次截尾样本 经验BAYES估计 compound system reliability performance progressively censored sample empirical Bayes estimation
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