摘要
CeO2/YSZ/CeO2 buffer layers were prepared on biaxial textured Ni-5at.%W substrate by direct-current magnetron reactive sputtering with the optimum process. YBCO thin films were deposited on CeO2/YSZ/CeO2 buffered Ni-5at.%W substrate at temperature ranging from 500℃ to 700℃ by diode de sputtering. By optimizing substrate temperature, pure c-axis oriented YBCO films were obtained. The mierostruetures of CeO2/YSZ/CeO2 buffer layers were characterized by X-ray diffraction. A smooth, dense and crack-free surface morphology was observed with scanning electron microscopy. The critical current density Jc about 0.75 MA/cm2 at 77 K was obtained.
CeO2/YSZ/CeO2 buffer layers were prepared on biaxial textured Ni-5at.%W substrate by direct-current magnetron reactive sputtering with the optimum process. YBCO thin films were deposited on CeO2/YSZ/CeO2 buffered Ni-5at.%W substrate at temperature ranging from 500℃ to 700℃ by diode de sputtering. By optimizing substrate temperature, pure c-axis oriented YBCO films were obtained. The mierostruetures of CeO2/YSZ/CeO2 buffer layers were characterized by X-ray diffraction. A smooth, dense and crack-free surface morphology was observed with scanning electron microscopy. The critical current density Jc about 0.75 MA/cm2 at 77 K was obtained.
