利用TFT-LCD像素结构衍射测试CCD图像采集系统的像素间距

An Approach to Measure Pixel Pitch of CCD Camera System by Using Structure Diffraction of TFT-LCD

研究了在范德卢格特型光学相关器中利用薄膜晶体管液晶显示器(TFT-LCD)替代靶板实物测试CCD图像采集系统像素间距的原理和方法,对由HN-480型CCD摄像机和OK-C21型图像采集卡组成的图像采集系统像素间距进行了现场测试,并对测试结果进行了误差分析.结果表明,该方法充分利用了光学相关器的现有组件,不需要其它设备,保证了图像采集系统像素间距的测试结果和实际工作性能的一致性,具有很强的实用性和可操作性.

An approach of measuring the pixel pitch of CCD Camera System is presented by using the diffraction of TFT-LCD structure in VanderLugt optical correlator. Its principle and testing method are studied and a typical of CCD camera system consisted of HN-480 model CCD sensor and OK-C21 model image grasp board is tested. The way did not need extra independent test bed and is suitable for VanderI.ugt correlator. The measurement results for the pixel pitch of CCD camera system is agreeable to its operational performance. The result shows that this approach has very strong practicability and effectiveness.