取向硅钢[001]晶向分布的非对称X射线衍射法测定

Determination of Distribution in Grain Oriented Silicon Steel by Asymmetrical X-Ray Diffraction Method

论述了采用固定2θ角,进行Ω扫描的非对称X射线衍射方法来测定取向硅钢易磁化方向[001]晶向分布的原理,以及针对取向硅钢板的具体情况采用叠片法对取向硅钢[001]晶向偏离角α、β角的测定方法(α为[001]晶向对轧向在轧面上的偏离角,β为[001]晶向对轧面的倾角)。利用该方法对取向硅钢的α、β角进行了测定,得到了α、β角的分布情况。讨论了对取向硅钢的α、β角进行半定量表示的方法,以及定量表示α、β角的途径。

A principle for determining the distribution of [001] crystal direction in 3% silicon steel has been explained by asymmetrical X-ray diffraction technique. It is based on Ω （the angle between the incidence X-ray beam and the surface of the sample tested） scanning while the 20 angle is kept at a constant value. A special method of evaluating the angles of α, β of laminated grain oriented silicon steel is developed （the angle of a refers to the deviation angle of [001] from rolling direction in the rolling plane; the angle of β refers to the tilt angle of [001] out of the sheet plane）. The method is used to determine the distribution of α,β of a kind of oriented silicon steel. The possible quantitative approach to characterize the angles of α, β in silicon steels is discussed.