蚀坑法求算取向硅钢再结晶织构的 ODF

ODF Determination of the Recrystallization Texture of Grain Oriented Silicon Steel from the Etch Figure

取向硅钢的再结晶织构因晶粒粗大而难以用Ｘ射线衍射测量．根据板材表面金相蚀坑的几何特征，确定了晶粒在欧拉空间的取向｛ψ，θ，φ｝，并编制出了由蚀坑测量参数直接求算ＯＤＦ的软件程序．采用该程序快捷而准确地求算了具有粗大晶粒的取向硅钢的三次再结晶织构．实算结果表明这种方法合理、实用，弥补了Ｘ射线织构分析方法之不足．

After the final annealing, the grain oriented silicon steel sheet is composed of coarse grains. It is difficult to measure the recrystallization texture by the Xray diffractometer,as is generally known that the etch figure can represent the grain orientation. According to the geometric feature of the etch figures, the grain orientation {ψ,θ,φ} in the Eular space can be deduced, and a practical program is presented to calculate the ODF directly from the parameters measured from the etch figure, with which the ODF of the grain oriented silicon steel after the tertiary recrystallization can be quickly determined. Experimental result shows that this method is reliable and simple. Thus the deficiencies of the Xray measurement can be overcome.