期刊文献+

DEFORMATION MEASUREMENT USING DUAL-FREQUENCY PROJECTION GRATING PHASE-SHIFT PROFILOMETRY 被引量:2

DEFORMATION MEASUREMENT USING DUAL-FREQUENCY PROJECTION GRATING PHASE-SHIFT PROFILOMETRY
下载PDF
导出
摘要 2π phase ambiguity problem is very important in phase measurement when a deformed object has a large out of plane displacement. The dual-frequency projection grating phaseshifting profilometry (PSP) can be used to solve such an issue. In the measurement, two properchosen frequency gratings are utilized to synthesize an equivalent wavelength grating which ensures the computed phase in a principal phase range. Thus, the error caused by the phase unwrapping process with the conventional phase reconstruct algorithm can be eliminated. Finally, experimental result of a specimen with large plastic deformation is given to prove that the proposed method is effective to handle the phase discontinuity. 2π phase ambiguity problem is very important in phase measurement when a deformed object has a large out of plane displacement. The dual-frequency projection grating phaseshifting profilometry (PSP) can be used to solve such an issue. In the measurement, two properchosen frequency gratings are utilized to synthesize an equivalent wavelength grating which ensures the computed phase in a principal phase range. Thus, the error caused by the phase unwrapping process with the conventional phase reconstruct algorithm can be eliminated. Finally, experimental result of a specimen with large plastic deformation is given to prove that the proposed method is effective to handle the phase discontinuity.
出处 《Acta Mechanica Solida Sinica》 SCIE EI 2008年第2期110-115,共6页 固体力学学报(英文版)
基金 the National Natural Science Foundation of China(No.10672065).
关键词 dual-frequency phase-shift profilometry projection grating phase unwrapping DEFORMATION dual-frequency phase-shift profilometry projection grating phase unwrapping deformation
  • 相关文献

参考文献10

  • 1Larkin,K.G.,and Oreb,B.F.Propagation of errors in different phase-shifting algorithms:a special property of the arctangent function[].Proceedings of SPIE the International Society for Optical Engineering.1993
  • 2Cheng,Y.Y,and Wyant,J.C.Two-wavelength phase shifting interferometry[].Applied Optics.1984
  • 3Sodnik,Z,Fischer,E,Ittner,T,and Tiziani,H.Two-wavelength double heterodyne interferometry using a matched grating technique[].Applied Optics.1991
  • 4Kim,M.K,and Parshall,D.Multi-wavelength phase imaging digital holography for biological microscopy[].Proceedings of SPIE the International Society for Optical Engineering.2004
  • 5De Groot,P.J.Extending the unambiguousrange of two-color interferometers[].Applied Optics.1994
  • 6Creath,K.Step height measurement using two-wavelength phase-shifting interferometry[].Applied Optics.1987
  • 7De Groot,P.J,and Kishner,S.Synthetic wavelength stabilization for two-color laser-diode interferometry[].Applied Optics.1991
  • 8Ai,C,and Wyant,J.C.Effect of piezoelectric transducer nonlinearity on phase shift interferometry[].Applied Optics.1987
  • 9Li,J.L,Su,H.J,and Su,X.Y.Two-frequency grating used in phase-measurement profilometry[].Applied Op- tics.1997
  • 10Robinson,D.W,and Reid,G.T.Interferogram Analysis:Fringe Pattern Measurement Techniques[]..1993

同被引文献9

引证文献2

二级引证文献5

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部