X射线荧光光谱法测定硅砂中杂质元素

XRF Spectrometry Determination of Impurities in Silica

在X射线荧光光谱法测定硅砂中杂质成分含量中对试样熔融所用的熔剂作了改进。在常用的四硼酸锂及硼酸锂所组成的复合熔剂中再加入氧化钙组成三元复合熔剂,加入的氧化钙与原两元复合熔剂两者之间以3与7的质量比混合。采用此改进的复合熔剂熔融试样,克服了在试样的玻璃状熔块中夹杂了不溶性二氧化硅颗粒的现象,即所谓"晶斑"现象,使试样达到完全分解。按此法,测得4项杂质组分(Al2O3,Fe2O3,MgO及TiO2)的含量与化学法测得结果相符。

In the XRF spectrometric determination of impurity components in silica, the flux used for fusion of sample was modified by adding CaO to the compound flux of Li2B4O7 ＋Li3BO3 mixture in the ratio of 3 parts （in grams） of CaO to 7 parts （in grams ）of the compound flux. By using this modified flux mixture, the appearance of insoluble silicon dioxide particles in the glassy fusion melt piece （usually called the crystalline speckle phenomenon） was eliminated, and complete decomposition of the silica sample was achieved. As shown by the analytical results of Al2O3, Fe2O3, MgO and TiO2 （present as impurity components in silica）, comformity with the results obtained by chemical methods was obtained.