摘要
本文介绍了一种测量荧光寿命的新方法:利用荧光衰减曲线和RC电路衰减曲线合成李萨如图形来测量固体荧光材料的荧光寿命。文中阐述了荧光寿命的测试原理,对激励光源、供电的脉冲电源和光电转换器进行了分析,用所设计的荧光寿命观测系统对Nd∶YAG晶体的荧光寿命进行了测量,得到的数值为230ns,与理论值相等。
A new method to measure fluorescence lifetime, which compose Lissajous figure to a straight line with fluorescence decay curve and RC curve line is described in this paper.The fluorescence lifetime testing principle is aslo introduced. The measure system with incentive source, Pulse supply, and optoelectronic devices systems are analyzed in this paper.Ultimately, the system which is designed measured the fluorescence lifetime of Nd：YAG crystal as 230 ns.
出处
《光机电信息》
2008年第6期39-43,共5页
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