摘要
为了能够测量复杂的面形物体,在基于调制度的光学三维测量研究中,提出利用改变光栅投影系统的物距,实现光栅图像对物体的纵向扫描,从而获取所测物体表面各点调制度的极大值,恢复物体的高度信息。运用此方法便于实现三维测量仪器的小型化,减少误差,可避免在相位测量中需要去包裹的问题。
To measure automatically complex object shapes, on the study of optical 3-D measurement based on modulation, we put forward a way to scanning the object lengthways by using changing object distance of the grating projection system, then can get the maximum modulation value of the object＇s surface pots and have the height information. This new processing method is convenient for miniaturization of 3-D measure instrument, reducing errors and is easy to avoid unwrapping in the phase measurement.
出处
《光学仪器》
2008年第3期18-21,共4页
Optical Instruments
关键词
物距
光栅图像
调制度
三维测量
object distance
grating image
modulation
3-D measurement
