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基于“Good”测试套件的GUI回归测试优化 被引量:2

A Regression Test Optimization Based on"Good"GUI Test Suite
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摘要 回归测试在软件测试过程中是非常重要的,同时也是非常费时费力的。为了适应软件测试的需求,提高回归测试的效率,降低测试成本,针对目前GUI回归测试的困难,依据Atif M.Memon等人提出的新的回归测试方法,根据一个"Good"的测试套件对测试成本和"fault-detection effectiveness"的影响,突出一个"Good"的测试套件的特点,给出一个新的回归测试方法。该方法根据测试套件的特点,有针对性地选择合适的测试用例来构建回归测试套件。这样不仅有针对性,同时也优化了测试套件,提高了测试效率。 The regression test is very important and time- consuming in software testing process. For the need of software testing, enhancing the effectiveness and reducing the cost of the testing, as for the current difficulty of GUI regression testing,in terms of a "Good" test suite' s effect on test cost and "fault- detection effectiveness", focusing on the character of a "Good" GUI' s test suite, proposes a new optimizing method of regression testing to structure test suite. According to the characteristic of a test suite,chose suited test case to build the test suite. So this method was not only pertinence,but also optimized the test suite,enhance the effectiveness of regression testing.
出处 《计算机技术与发展》 2008年第7期1-4,共4页 Computer Technology and Development
基金 国家"863"计划基金项目(2006AA12A104)
关键词 回归测试 “Good”测试套件 覆盖标准 GUI regression testing "Good"test suite coverage criteria GUI
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参考文献6

  • 1Memon A M. GUI Testing: Pitfalls and process[J] .Software Technologies, 2002 (8) : 87 - 88.
  • 2Memon A M, SOfia M L. Regression Testing of GUIs[ C]// Proceedings of the 9th ACM/IEEE European Software Engineering Conference (ESEC) and 11th ACM SIGSOFT International Symposium on the Foundations of Software Engineering (FSE - 11 ). Helsinki, Finland: [ s. n. ] ,2003:118 - 121.
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  • 4Memon A M,PoUack M E,Sofia M L. Hierarchical GUI test case generation using automated planning[ J ]. IEEE Trans on Software Engineering,2001,27(2) :144 - 155.
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  • 6Memon A M, Sofia M L, Pollack M E. Coverage Criteria for GUI Testing[ C] //Proceedings of the 8th European Software Engineering Conference (ESEC) and the 9th ACM SIGSOFT Imernational Symposium on the Foundations of Software Engineering. Austria: Vienna University of Technology, 2001 : 256 - 267.

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