中小规模逻辑电路单粒子效应实验研究

EXPERIMENTAL INVESTIGATION ON SINGLE EVENT EFFECTS OF SMALL SCALE/ MEDIUM SCALE LOGIC CIRCUITS

介绍了中小规模逻辑电路的单粒子效应实验。单粒子效应实验是在中国原子能科学研究院核物理国家实验室的ＨＩ－１３型串列加速器上完成的。用６０Ｃｏγ射线辐照至一定剂量后再用重离子轰击，在不同总吸收剂量下获得了σ－ＬＥＴ曲线。对实验结果进行了讨论并得出中小规模逻辑电路的单粒子效应不容忽视的结论。

The single event effects experiments of small scale / medium scale logic circuits are presented.The DUTs (devices under test) were irradiated by 60 Co gamma rays to different doses before bombardments by heavy ions from the tandem accelerator of HI 13 type of Beijing tandem accelerator nuclear physics national laboratory.The σ vs LET curves were measured for different total absorbed doses.The experimental results are discussed.