摘要
介绍了中小规模逻辑电路的单粒子效应实验。单粒子效应实验是在中国原子能科学研究院核物理国家实验室的HI-13型串列加速器上完成的。用60Coγ射线辐照至一定剂量后再用重离子轰击,在不同总吸收剂量下获得了σ-LET曲线。对实验结果进行了讨论并得出中小规模逻辑电路的单粒子效应不容忽视的结论。
The single event effects experiments of small scale / medium scale logic circuits are presented.The DUTs (devices under test) were irradiated by 60 Co gamma rays to different doses before bombardments by heavy ions from the tandem accelerator of HI 13 type of Beijing tandem accelerator nuclear physics national laboratory.The σ vs LET curves were measured for different total absorbed doses.The experimental results are discussed.
出处
《原子能科学技术》
EI
CAS
CSCD
北大核心
1997年第3期267-271,共5页
Atomic Energy Science and Technology
关键词
单粒子效应
总吸收剂量
航天器
逻辑电路
SEE (single event effect) SEU (single event upset) Total absorbed dose LET (linear energy transfer) SEU cross section(σ)