摘要
利用三维TCAD混合模拟研究了温度对0.18μm工艺下反相器链中DSET脉冲宽度的影响.结果发现,温度对DSET的影响要比温度对SEU的影响严重得多.在LET为60MeV.cm2/mg的条件下,当温度从-55℃升高到125℃时,DSET脉冲宽度约增加了58.8%.
Using mixed-mode simulation,the temperature dependence of digital single event transient (DSET)in an inverter chain has been studied. It was found that the temperature dependence of DSET is much more serious than that of SEU. When the temperature rises from -55 to 125℃ ,the width of DSET increases about 58. 8%.
基金
武器装备预研基金资助项目(批准号:9140A08040507KG01)~~
关键词
混合模拟
DSET
超深亚微米
辐射
mixed-mode simulation
DSET
very deep sub-micron
radiation