期刊文献+

磁性薄膜微波电磁参数测试方法研究进展

Research progress of measured methods for microwave electromagnetic parameter of magnetic thin films
下载PDF
导出
摘要 Fe、Co基合金薄膜具有高磁导率、高损耗等特点,可实现微波的宽频带吸收,是一类具有很大发展潜力的新一代吸波材料。磁性膜的复磁导率对吸波性能有重大影响,因而在吸波材料研究中提出了磁谱测量的紧迫要求。综述了国内外磁性薄膜电磁参数微波测量方法,主要介绍了磁性薄膜电磁参数的谐振腔法、双线圈法和传输线法,并对当前研究中存在的问题进行了讨论。 The Fe, Co-based alloy thin films were considered to be newly potential microwave absorbing materials On account of the high permeability, high loss, etc. The complex permeability of magnetic thin films was a significant parameter for the microwave-absorbing capability, and thus the measurement of the complex permeability of this films was proposed to be urgent. A series of electromagnetic parameters measured methods of thin film, such as the cavity perturbation method, the pick-up coil method and the transmission line method, were critically reviewed at home and abroad. The problems in these methods were discussed.
出处 《电子元件与材料》 CAS CSCD 北大核心 2008年第7期4-6,10,共4页 Electronic Components And Materials
基金 国家自然科学基金资助项目(No.50371029) 新世纪优秀人才支持计划资助项目(No.NCET-04-0702)
关键词 电子技术 磁性薄膜 综述 电磁参数 微波测量 研究进展 electron technology magnetic thin film review electromagnetic parameter microwave measurement research progress
  • 相关文献

参考文献15

  • 1Jiang J J, Du G, Yun Y, et al. A new perturbation method for determining the broadband complex permeability of magnetic thin films [J]. J Magn Magn Mater, 2008, 320: 148--151.
  • 2张秀成,聂彦,何华辉,江建军.薄膜材料复介电常数与复磁导率测试研究[J].华中科技大学学报(自然科学版),2004,32(4):90-92. 被引量:12
  • 3Carter R G. Accuracy of microwave cavity perturbation measurements [J]. IEEE Trans Microwave Theory Tech, 2001, 49(5): 918-923.
  • 4Li D Q, Charles F. A simple method for accurate loss tangent measurement of dielectrics using a microwave resonant cavity [J]. IEEE Microwave Wireless Compon Lett, 2001, 11 (3): 118- 120.
  • 5Grimes C A, Trouilloud P L, Walser R M. A new swept frequency permeameter for measuring the complex permeability of thin magnetic filems [J]: IEEE Trans Magn, 1988, 24(1): 603--610.
  • 6Yamaguchi M, Yabukami-S, Arai I K. Development of multilayer planar flux sensing coil and its application to 1 MHz-3.5 GHz thin film permeance meter [J]. S ens Actuat, 2000, 81:212-215.
  • 7Yamaguchi M, Acher O, Miyazawac Y, et al. Cross measurements of thin-film permeability up to UHF range [J], J Magn Magn Mater, 2002, 245: 970-972.
  • 8Hinojosa J. S parameter broadband measurements on microstrip and fast extraction of the substrate intrinsic properties [J]. IEEE Microwave Wireless Comport Lett, 2001, 11(7): 80-82.
  • 9Ledieu M, Schoenstein F, Le Gallou J-H, et al. Microwave permeability spectra of ferromagnetic thin films over a wide range of temperatures [J]. J Appl Plays, 2003, 93(10): 7202-7204.
  • 10Ledieu M, Acher O New achievements in high-frequency permeability measurements of magnetic materials [J]. J Magn Magn Mater, 2003, 258-259: 144- 150.

二级参考文献10

  • 1Korenivski V, van Dover R B, Mankiewieh P M,et al.[J]. IEEE Trans Magn,1996, 32: 4905.
  • 2Moulder J C, Tai C C, Larson B F, et al. [J]. IEEE Trans Magn,1998, 34: 505.
  • 3Hammerstad E O. European Microwave Conference Proceedings [C]. European Microwave Conf, 1975. 268.
  • 4Bekker V, Seemann K, Leiste H. [J]. Journal of Magnetism and Magnetic Materials,2004, 270. 327-332.
  • 5Fessant A, Gieraltowski J, Loaec J. Influence of in plane anisotropy and eddy currents on the frequency spectra of the complex permeability of amorphous CoZr thin films. IEEE Trans Magn, 1993, 29(1): 82-87.
  • 6Laumo N J, Makovicka T J. Measurement of the permeability of thin film. Review of Scientific Instruments, 1999, 70(4) : 2 072-2 073.
  • 7Daiqing L, Charles F. A simple method for accurate loss tangent measurement of dielectrics using a microwave resonant cavity. IEEE Microwave and Wireless Components Letters, 2001, 11(3): 118-120.
  • 8Yabukami S, Uo T, Yarnaguchi M. High sensitivity permeability measurement of striped films obtained by input impedance. IEEE Trans Magn, 2001, 37(4) :2 776-2 778.
  • 9Yamaguchi M, Acher O, Miyazawa Y. Cross measure ment of thin film permeability Up to UHF range. J Magn Magn Mat, 2002, 242-245:970-972.
  • 10Ida N. Engineering electroma~gnetics. New York: Springer Verlag Inc., 2000.

共引文献15

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部