提高HIFU焦斑精度的研究与探索

Research and Exploration on Improvement of HIFU Focal Spot Accuracy

目的:提高HIFU焦斑精度。方法:结合实际研制过程,从机械装备的角度分析了影响HIFU焦斑精度的各种因素,通过单探头声场测量筛选压电陶瓷片保证一次聚焦精度,通过合理的结构设计和加工方案规划来保证聚焦体二次聚焦精度。结果:Φ66探头用一般定位H7h6间隙配合可保证定位误差e控制在0.05 mm之内,如果将(β+)γ控制在0.12°之内,则可将焦斑精度控制在0.5 mm以内。结论:在HIFU设备研制过程中,通过采取改进措施保证二次聚焦精度,可以提高焦斑精度。

Objective To improve HIFU focal spot accuracy. Methods Combining with actual production, the influencing factors of ultrasound spot accuracy were analyzed from the aspect of mechanical equipment. In order to ensure the first focal accuracy, suitable piezoelectric ceramics flakes were selected by measuring single probe acoustic field. Reasonable designing projection planning was used to ensure the second focal accuracy. Results By means of general positioning of H7h6 clearance fit, focal spot accuracy error of φ66mm probe was kept under 0.05mm. If（β＋γ）was kept under 0.12°, the focal spot accuracy could be controlled under 0.5mm. Conclusion During the development of HIFU, focal spot accuracy can be improved by taking effective measures to ensure two focal accuracies.