基于衰减全反射结构的微小位移的实时测量

Real-Time Measurement in Small Displacement Based on the Attenuated Total Reflection Technique

利用衰减全反射结构制作出一种新型实时测量微小位移的传感器.方法是用带有一定入射角宽度的光束代替传统的角度扫描,在计算机屏幕上同时显示标志波导模式的一组暗线.当外界工作条件发生变化,暗线就会随之移动,利用屏幕上暗线的移动来测量微小位移.研究表明,该器件测量实时性强、精确度较高、设备简单、成本低、易于调节等诸优点,预计在微加工等领域具有潜在的应用价值.

A simple displacement measurement based on the attenuated total reflection technique is proposed and experimentally demonstrated. By analyzing the fringe shift of the reflective pattern recorded on a CCD camera, a slight displacement, which corresponds to a change in the waveguide thickness, can be determined in real time with adequate accuracy. The measurement range of this method is about 250 μm, and its accuracy can reach 0.015 3 μm.