摘要
采用外部检查和气密性检测等试验方法,对长期存贮的电荷耦合器件(CCD)的质量进行评价。对失效原因进行了分析,进而提出了在CCD的封装、贮存和运输过程中,提高CCD可靠性的具体方法,可保证其贮存寿命在10年以上。
The quality of long storage CCDs was evaluated by external inspection and hermeticity detection. The failure cause was analyzed. Specific measures for improving the reliability of CCDs during its packing, storage and transportation were presented to ensuring the storage lifetime of more than 10 years.
出处
《电子产品可靠性与环境试验》
2008年第3期28-31,共4页
Electronic Product Reliability and Environmental Testing
