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FPGA测试技术研究 被引量:6

Test Technology Research for FPGA
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摘要 随着FPGA的规模和复杂性的增加,测试显得尤为重要。FPGA测试对技术人员极具挑战性。首先介绍了SRAM型FPGA的结构概况,总结出FPGA的测试方法并应用于FPGA电路的实际测试,对FPGA测试技术进行了有益的探索。 As FPGA increase in size and complexity, complete and correct testing is increasingly important. Testing an FPGA chip poses a challenging problem for test engineers. In this paper an outline of the SRAM - based FPGA structure is given,we propose a general methodology for test FPGA on which was carried out and it is beneficial exploration to test for FPGA.
作者 薛宏 赵欣
出处 《微处理机》 2008年第2期11-14,共4页 Microprocessors
关键词 现场可编程门阵列 存储器型FPGA 可编程逻辑块(CLB) 连线资源 FPGA SRAM - based FPGA Configurable logic block (CLB) Interconnect Resource
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参考文献2

  • 1Abderrahim Doumar and Hideo Ito, Detecting, Diagnosing, and Tolerating Faults in SRAM- Based Field Programmable Gate Arrays : A Survey [ J ]. IEEE TRANS- ACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS ,2003,11 (3) :53 - 67.
  • 2H Elhuni and al. C - testability of two - dimensional iterative arrays [J]. IEE Trans. Computer - Aided Design, 1986,vol CAD - 5:573 - 581.

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