摘要
随着FPGA的规模和复杂性的增加,测试显得尤为重要。FPGA测试对技术人员极具挑战性。首先介绍了SRAM型FPGA的结构概况,总结出FPGA的测试方法并应用于FPGA电路的实际测试,对FPGA测试技术进行了有益的探索。
As FPGA increase in size and complexity, complete and correct testing is increasingly important. Testing an FPGA chip poses a challenging problem for test engineers. In this paper an outline of the SRAM - based FPGA structure is given,we propose a general methodology for test FPGA on which was carried out and it is beneficial exploration to test for FPGA.
出处
《微处理机》
2008年第2期11-14,共4页
Microprocessors