摘要
在光弹性试验中,由于各种不利因素的影响,往往不能精确测得等差线级数。本文介绍了用应力梯度曲线的方法,较精确地得到所测条纹级数,从而使试验和计算结果更准确。
In photoelasticity experiment,it is usually difficult to measure the series of equidifferent line precisely due to various factors.The paper introduces a method of stress gradient curve,with which we can get the figure measured more precisely and make the results of the rexperiment and calculations more accurate.
关键词
光弹性
应力梯度
等差线
试验
photoelasticity,stress gradient,equidifferent line