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IC内置熔丝熔断方法 被引量:1

IC Fuse Blowing Method
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摘要 集成电路的发展对电路的精准度和可编程性提出了更高的要求。低成本、高灵活性的熔丝结构由此得到了大范围的应用。熔丝可调节方案随着熔丝数目的增加而呈指数倍数增加。在编写测试软件时,传统方法是机械地用if…else语句来编程,程序将是非常的冗长且可读性差。文章在总结传统测试方法弊端的基础之上提出了一种可用于准确、有效地熔断IC内置熔丝的新方法。通过寻找实际测量结果和对应熔断熔丝之间的规律,将数量级为2n的熔丝熔断分析缩减至n次熔丝熔断分析。这种做法使程序简洁而又逻辑性强。 The development of integrate circuit needs high precision and programmable. Low cost and high flexible fuse structure IC is well-used. Analysis amount of fuse adjusting method goes up with the numbers of fuse exponentially. While programming, we use if...else language by rote in traditional method, this make test program long and unreadable. This paper present a new fuse blowing method which blow fuse exactly and effectively based on the traditional method. By finding the rule between real test result and corresponding fuse, we reduce the analysis amount from 2^n to n. This makes test program concision and strong logicality.
作者 陆强 孙明
出处 《电子与封装》 2008年第7期26-30,共5页 Electronics & Packaging
关键词 测试程序 熔丝熔断 可编程逻辑电路 test program fuse blowing PLC
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同被引文献5

  • 1Test Technology Standards Committee of the IEEE Computer Society [S]. IEEE Standard Test Access Port and Boundary-Scan Architecture, 2001-06.
  • 2Mentor Graphics. Embedded Deterministic Test (EDTTM) - DFT Technology for High-Quality LowCost Manufacturing Test [M]. Technical Publication, 2006-03.
  • 3Frank Poehl, Matthias Beck. Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions [Z]. ITC 2003.
  • 4Mentor Graphics. Memory BIST Training Workbook [S]. 2003-08.44-48.
  • 5S Barbagallo A, Burri D Medina. An experimental comparison of different approaches to ROM BIST [Z]. IEEE, 1991.

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