摘要
介绍了MTS810-5T疲劳试验机的数字函数发生器单元(410.31)无法产生正常各种试验波形的故障情况,并分析出现该故障的原因以及制订相应的维修方案。结果表明,该故障是算术逻辑部件(ALU)不能进行正常的数学运算所造成的,更换算术逻辑部件后,试验机的函数发生器单元恢复正常使用。
The breakdown which function generator of testing machine MTS810-5T that do not generate various waveforms is described. Moreover, the breakdown reasons are analyzed repair plans and set down. The troublesome of cause that the arithmetic logical unit （ALU） is damaged, and replaced ALU with good one. The testing machine is got right.
出处
《理化检验（物理分册）》
CAS
2008年第7期395-396,共2页
Physical Testing and Chemical Analysis(Part A:Physical Testing)
关键词
试验机
函数发生器
波形
故障
维修
Testing machine
Function generator
Waveform
Breakdown
Reparation
