摘要
目的探讨SD大鼠弥漫性轴索损伤(DAI)中c-fos、c-jun基因表达及变化规律。方法将30只SD大鼠分为对照组、实验组、30min组、1h组、2h组、6h组,每组6只大鼠。自制颅脑瞬间DAI模型致伤,采用免疫组织化学技术检测脑损伤后c-fos、c-jun基因表达。结果实验显示脑组织中c-fos、c-jun基因30min即有表达,1h有所增强,2h达到高峰,6h逐渐下降,且皮层、白质、脑干、丘脑、小脑均呈弥漫性表达。结论c-fos、c-jun基因表达的变化规律和特点与颅脑损伤机制、继发性脑损伤有关。
Objective To investigate the expression of c-fos and c-jun genes in SD rat brain tissue after head injury. Methods Thirty SD rats were divided into normal group and experimental groups (30 min, 1 h, 2 h,6 h groups) with 6 rats in each group. Based on the rat model of diffuse axonal injury ( DAI), the c-fos and c-jun positive neurons were observed in the experimental group at 30 min, 1 h, 2 h, and 6 h after trauma by immunochemical Methods. Results C-fos and c-jun positive neurons could be found in the cortex, white matter, brain stem,thalamus and cerebellum. The c-fos and c-jun positive expression could be detected at 30 min after DAI, enhanced at 1 h, peaked at 2 h, and began to decrease at 6 h after DAI. Conclusion The expression of c-fos and c-jun genes may be related to different injury mechanism and secondary brain injury.
出处
《实用医院临床杂志》
2008年第4期37-39,共3页
Practical Journal of Clinical Medicine