摘要
在0~150℃范围测量了Pb(Zr0.48Ti0.52)O3(PZT)陶瓷薄片的电滞回线和微分电滞回线。发现电滞回线高度在升温过程中出现升高的现象,这与铁电唯象理论相矛盾。为此提出精确测定纯铁电参数的方法,该方法可分离出回线中直流电导,非铁电性电容的影响,从而得到纯铁电效应的信号。实验结果与PZT中准同型相界的存在相吻合。
Hysteresis loop and differential hysteresis loop of Pb (Zr0 48Ti0. 52 )03 (PZT) ceramics have been measured in the temperatures from 0 to 150℃. It is found that with the increase of temperatures, the height of hysteresis loop becomes larger, which is conflictive to the phenomenological theory of ferroelectricity. For this reason, a more precise measuring method for obtaining pure ferroelectric effect based on differential hysteresis loop is proposed. Using this method, the influence of DC conductance, non-ferroelectric linear capacitance can be eliminated, and obtain the signal of pure ferroelectric effects. The experimental result is in agreement with the existence of morphotropic phase boundary in PZT.
出处
《中山大学学报(自然科学版)》
CAS
CSCD
北大核心
2008年第4期47-50,共4页
Acta Scientiarum Naturalium Universitatis Sunyatseni
基金
广东省自然科学基金博士科研启动基金资助项目(05300580)
惠州市科技计划资助项目(2005G49)
关键词
电滞回线
铁电参数
锆钛酸铅
hysteresis loops
ferroelectric parameter
lead zirconate titanate