摘要
从Flash memory测试技术的发展背景出发,论述了flash memory测试技术的发展现状以及前景。同时重点对Flash-march算法和BF&D算法进行了分析和评价。指出Flash memory的发展是以测试技术的发展为基础的,必须把Flash memory本身的发展和测试技术的发展综合考虑,才能有助于两者的协调发展。
Looking hack to its evolving background, the development as well as the future of flash memory is discussed. The discussion is put emphasis on the Flash-march algorithm and BF& algorithm, It is pointed that the development of flash memory is based on the development of testing, In order to keep together with flash memory and testing, we must bring testing into account with flash memory development synthetically,
出处
《电子器件》
CAS
2008年第4期1130-1133,共4页
Chinese Journal of Electron Devices