ICP-AES测定高纯铜中多种杂质元素

Determination of multi-impurity elements in high pure copper by ICP-AES

本文利用电感耦合等离子发射光谱法（ICP-AES）测定高纯铜中的多种杂质元素Mn,Fe,Ni,Zn,Ag,Sn,Sb,P,As,Se。对入射功率、雾化压力等分析条件进行优化。该方法简便、快速,可满足分析要求。杂质元素的检出限为2-10μg/g,回收率在85%-105%范围内。

A method was described for simultaneous determination of multielements such as Mn, Fe, Ni, Zn, Ag, Sn, Sb, P, As, Se in high pure copper by Inductively Coupled Plasma Atomic Emission Spectrometry （ICP-AES） in thispaper. The operational parameters of input power and carrier gas pressure et al were optimized. The method is simple and can meets the requirement of analysis. The detection limit of analyte elementsin the high pure copper sample ranged from 2 μ g/g to 10μ g/g, the recovery was within the range of 85%-105%.