基于CCD技术的纱线疵点检测的研究

Study on yarn defect test based on CCD technology

介绍了纱线疵点的检测方法,讨论了测量系统的构成,给出了该系统硬件原理图,分析了系统的工作原理。该系统硬件线路简单可靠,配有与上位机通信的USB接口,能高速实时地将纱线疵点图像信息传送至上位PC计算机。通过对虚拟示波器DSO-2902的二次开发,实现了对整个检测过程的控制,系统能显示和保存计算得到的结果,为用户提供了良好的人机界面。

This text introduces the test method of yam defect with the constitution of measurement system discussed and the hardware schematic diagram and operating principle of the system given. This system features simplicity, reliability and high ratio of capability to price, and it can transmit the yam defect image information to host - computer with the USB interface in time. After the secondary development of virtual oscillograph DSO - 2902, the process control of whole inspection system is achieved, and all the calculation results can be saved and displayed on computer. The secondary development provides better human computer interface for the inspection system.