可简化并行处理器设计的JTAG测试

JTAG Test of Simplifiable Parallel Processor Design

ＪＴＡＧ（联合测试行动组织）边界扫描是芯片和系统设计的重要组成部分。文中介绍ＪＴＡＧ边界扫描的概念、技术特点，以及在芯片功能测试、系统诊断、仿真、性能分析和导通测试方面的应用。

The JTAG boundary scan mechanism is becoming more and more important in both chip and system design. This paper focuses on the JTAG ideas and technical characteristics and summarizes the JTAG usage in chip function test, system diagnosis, simulation, performance analysis and conduction test.