摘要
在各种单片微机测控系统中,RAM的正常与否直接关系到该系统的正常工作,RAM的自检可有效地避免RAM不正常工作给系统带来的损害。本文讨论了单片微机应用系统中RAM自检的方法。
In all kinds of control systems by a microcontroller , it is very important to make sure of RAMs normality in order to avoid unexpected harms. In this paper we discuss this prob-lem and give some new methods on. elf-checking of RAMs.
出处
《测控技术》
CSCD
1997年第4期25-26,共2页
Measurement & Control Technology