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利用数字锁相技术的频率域PDP荧光粉寿命测量方法

Fluorescence lifetime measurement of PDP phosphor in frequency domain using digital lock-in detection
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摘要 荧光寿命是PDP(等离子体平板显示)用荧光粉一个重要参数,以氟化镁端窗型氘灯为激发光源,利用正弦波调制方法对灯放电电流进行控制,实现真空紫外波段的激发光信号调制,通过数字锁相技术准确获得激发光和粉体荧光间的相位差从而获得荧光寿命参数,给出了实现算法;考虑到PDP荧光粉的寿命为毫秒量级,合理的调制频率设定为100Hz,AD采集速率100K,采样10000点,受噪声影响获得的位相余弦值误差为0.0001,对应的寿命最大相对误差为1.4%.从实验结果来看,精度达到要求. Fluorescence lifetime is an important factor of PDP phosphor. The excitation light source is a deuterium lamp with MgF2 head-on window. The current through the lamp is controlled by sinusoidal modulation method. Thus, the modulation of the VUV-band excitation light is realized. Accurate phase difference between excitation light and fluorescence is acquired by digital locked-in detection and then lifetime can be obtained. The realization algorithms are given. Taking into account micro-second magnitude for the lifetime of PDP phosphor, the modulation frequency is reasonably set up at 100 Hz, analog-to-digital converting sample rate is 100 K, the error of cosine value of phase is about 0. 000 1 every 10 000 samples because of noise. The maxim relative error of lifetime is 1.4%. The precision is satisfied according to the experiment result.
出处 《辽宁师范大学学报(自然科学版)》 CAS 北大核心 2008年第3期300-303,共4页 Journal of Liaoning Normal University:Natural Science Edition
基金 国家自然科学基金资助项目(5050326) 大连民族学院博士启动基金资助项目(20056210)
关键词 荧光粉 荧光寿命 数字鉴相 位相 phosphor fluorescence lifetime digital lock-in phase
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  • 1Kim C H,Bae H S,Pyun C H.Phosphors for plasma display panels[A].Journal of the Korean chemical society[C],Korea:Republic of Korea,1998.588-595.
  • 2张国威 王兆民.激光光谱学原理与技术[M].北京:北京理工大学出版社,1991..
  • 3Zhang Z Y,Grattan K T V. Fiber optic thermometry based on Cr-fluorescence in olivine crystals[J]. Rev.Sci. Instrum. ,1997,68(6) :2 418-2 421.
  • 4Anghel F,Lliescu C,Grattan K T V. Fluorescent-based lifetime measurement thermometer for use at subroom temperatures (200~300 K) [J]. Rev. Sci. Instrum. ,1995,66(3) :2 611-2 614.
  • 5Grattan K T V, Palmer A W. Temperature dependences of fluorescence lifetimes in Cr3+-doped insulating crystals [J]. Phys. Rev. B, 1993, 48 ( 11 ):7 772-7 778.
  • 6金玉丰,朱昌昌,王绪丰.PDP单元真空紫外辐射的测量[J].光电子技术,2000,20(3):196-200. 被引量:1
  • 7蔡红红,卜忍安,王文江.彩色PDP荧光粉的劣化研究[J].发光学报,2002,23(2):197-200. 被引量:16

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