用高频红外碳硫仪测定碳化硅的纯度

Determination of Silicon carbide Pureness Used of High Frequency Infrared Carbon sulphur Instrument

本文报道了用高频红外碳硫仪测定碳化硅纯度的新方法。试样在瓷坩埚中灼烧，去除游离碳及挥发份，选铁屑与钨粒的混合物作助熔剂，在高频红外碳硫仪上测定ＳｉＣ中碳的含量，由此换算出ＳｉＣ的含量。方法简单、快速、准确。

This paper introduces a new method for determining,silicon carbide pureness used of high frequency infrared carbon sulphur instrument Through burning sample in porcelain crucible to remove free carbon and volatile matter and selecting the mixture of iron scrap and tungsten grain as flux,the carbon content of silicon carbide can be determined in high frequency infrared carbon sulphur instrument and the silicon carbide content can be calculated according to it This method is simple,quick and accurate