摘要
简单介绍了扫描隧道显微镜(STM)和原子力显微镜(AFM)的工作原理,并详细阐述了实验过程中有时会遇到的异常情况及其处理方法,以便获得最佳的样品图像。
This paper briefly introduces the operation principles of Scanning Tunneling Microscope (STM) and Atomic Force Microscope (AFM),and elaborates some unusual cases encountered in the course of experiment and their processing methods to obtain the best sample image.
出处
《渤海大学学报(自然科学版)》
CAS
2008年第3期268-271,共4页
Journal of Bohai University:Natural Science Edition