摘要
论述了微波暗室静区反射率电平的测量方法和微波场强校准原理,分析了反射率电平对标准场法微波场强校准的影响。
It discusses the method for measuring reflectance level and the principle for calibrating microwave field strength in the quiet zone of microwave anechoic chamber, and analyes the influence of reflectance level at calibrating microwave field strength using the method of standard field.
出处
《计测技术》
2008年第4期31-34,共4页
Metrology & Measurement Technology
关键词
微波暗室
反射率电平
场强
校准
microwave anechoic chamber
reflectance level
field strength
calibrate
