摘要
利用一组规则栅线投影到物体表面的畸变光栅,采用线性相位FIR滤波技术解调出含有物体表面高度信息的相位。建立了一种较二维FFT法更快,精度较高的光学检测技术。该技术只需采集一幅图象,不需要确定条纹级次,不存在“凹凸模糊”的问题。文中给出了一个典型试件的实验结果及分析。
An optical tehcnique for 3 D shape measurement is set up.The technique,based on a deformed projected grating pattern which carries the 3 D information of the measured object,can automatically and accurately obtain the phase map of a measured object by using a liner phase FIR filter.In contrast to the 2 D FFT technique,the technique is much faster.Only one image pattern is sufficient for measuring.The phase map can be processed without assigning fringe orders and making distinction between a depression and an elevation.Theroetical analysis and experimental result are presented.
出处
《光电子.激光》
EI
CAS
CSCD
1997年第5期394-397,共4页
Journal of Optoelectronics·Laser
关键词
投影栅相位法
线性相位
FIR滤波
三维形貌检测
phase profilometry of projected grating
linear phase FIR filter
3 D surface contouring